Invited speakers
Plenary Talks
Jamal Deen “Low-Frequency Noise in Semiconductor Devices – State-of-the-Art and Future Perspectives”
McMaster University, CANADA
Joel P. Dunsmore “From Zero to Infinity: Uncertainty and Accuracy in Noise Figure Measurements”
Keysight Technologies, USA
Invited Talks
Adeline Crépieux “Extracting information from the mixed electrical-heat noise”
Centre de Physique Théorique, FRANCE
Francois Danneville "In situ noise parameters extraction of SiGe HBTs in mm-W range"
Université Lille1, FRANCE
Pertti Hakonen “Extracting coherence and entanglement from vacuum noise”
Aalto University, FINLAND
Henri Happy “RF and noise performance of GFETs”
IEMN, FRANCE
Vadim S. Khrapai “Local measurement of the electronic noise”
Institute of Solid State Physics, Russian Federation
Laszlo B. Kish “Facts and myths about zero-point thermal noise and information entropy versus thermal entropy”
Texas A&M University, USA
Ken Kiyono “Theory and applications of detrending-operation-based fractal-scaling analysis”
Osaka University, JAPAN
Tomaš Navotny “Voltage noise, multiple phase-slips, and switching rates in moderately damped Josephson junctions”
Charles University, CZECH REPUBLIC
Mindaugas Ramonas ”Microscopic modeling of fluctuations in polar semiconductors with high density electron gas“
CPST Semiconductor Physics Institute, LITHUANIA
Sergey L. Rumyantsev “Low frequency noise in 2D materials: graphene and MoS2”
Rensselaer Polytechnic Institute, USA