Invited speakers

Plenary Talks

Jamal Deen “Low-Frequency Noise in Semiconductor Devices – State-of-the-Art and Future Perspectives”
McMaster University, CANADA

Joel P. Dunsmore “From Zero to Infinity: Uncertainty and Accuracy in Noise Figure Measurements”
Keysight Technologies, USA

Invited Talks

Adeline Crépieux “Extracting information from the mixed electrical-heat noise”
Centre de Physique Théorique, FRANCE

Francois Danneville "In situ noise parameters extraction of SiGe HBTs in mm-W range"
Université Lille1, FRANCE

Pertti Hakonen “Extracting coherence and entanglement from vacuum noise”
Aalto University, FINLAND

Henri Happy “RF and noise performance of GFETs”
IEMN, FRANCE

Vadim S. Khrapai “Local measurement of the electronic noise”
Institute of Solid State Physics, Russian Federation

Laszlo B. Kish “Facts and myths about zero-point thermal noise and information entropy versus thermal entropy”
Texas A&M University, USA

Ken Kiyono “Theory and applications of detrending-operation-based fractal-scaling analysis”
Osaka University, JAPAN

Tomaš Navotny “Voltage noise, multiple phase-slips, and switching rates in moderately damped Josephson junctions”
Charles University, CZECH REPUBLIC

Mindaugas Ramonas ”Microscopic modeling of fluctuations in polar semiconductors with high density electron gas“
CPST Semiconductor Physics Institute, LITHUANIA

Sergey L. Rumyantsev “Low frequency noise in 2D materials: graphene and MoS2”
Rensselaer Polytechnic Institute, USA